http://caligraph.org/ontology/Materials_analysis_method

Property	Value
rdf:type	owl:Class
rdfs:label	Materials analysis method
rdfs:subClassOf	owl:Thing
prov:wasDerivedFrom	http://en.wikipedia.org/wiki/List_of_materials_analysis_methods
is rdf:type of	Solid-state nuclear magnetic resonance CFM Intelligent gravimetric analysis Ultrafast low-energy electron diffraction Surface-enhanced Raman spectroscopy Microthermal analysis Porosimetry Ultraviolet photoelectron spectroscopy Helium atom scattering Electrospray ionization Liquid chromatography–mass spectrometry Raman spectroscopy Sputtering Fluorescence-lifetime imaging microscopy Solid immersion lens Fluorescence cross-correlation spectroscopy Neutron diffraction High-resolution transmission electron microscopy Mössbauer spectroscopy Photoacoustic spectroscopy Tandem mass spectrometry Ultrasonic testing Low-energy electron microscopy Raman scattering Gas chromatography–mass spectrometry KPFM Coaxial impact collision ion scattering spectroscopy SHPM Electrical capacitance tomography Field-emission microscopy Scanning capacitance microscopy Scanning tunneling spectroscopy Selected area diffraction Ion beam analysis Stark effect Immunofluorescence High-performance liquid chromatography Infrared spectroscopy Photoacoustic imaging Single-photon emission computed tomography X-ray fluorescence Atomic force microscopy Fluorescence anisotropy Coherent anti-Stokes Raman spectroscopy Dynamic vapor sorption Atomic absorption spectroscopy Electrical impedance tomography Photothermal spectroscopy Rutherford backscattering spectrometry Scanning tunneling microscope Multifocal multiphoton microscopy Electron cryotomography Scanning ion-conductance microscopy Capillary electrophoresis Grazing incidence diffraction Deep-level transient spectroscopy X-ray absorption fine structure X-ray standing waves Reflectance difference spectroscopy Reflection high-energy electron diffraction Scanning transmission electron microscopy Dual-polarization interferometry Annular dark-field imaging Matrix-assisted laser desorption/ionization Electron paramagnetic resonance Dynamic light scattering Magnetic force microscope Magnetic induction tomography Atom probe Electrophoretic light scattering Small-angle X-ray scattering Ultrasound attenuation spectroscopy Dielectric spectroscopy Scanning confocal electron microscopy Dynamic mechanical analysis Neutron depth profiling Analytical ultracentrifugation Photoemission electron microscopy Scanning electron microscope Photoemission spectroscopy Auger electron spectroscopy Flow birefringence Isothermal titration calorimetry Confocal microscopy Resonant inelastic X-ray scattering Atomic emission spectroscopy Coherent diffraction imaging Electroluminescence X-ray photoelectron spectroscopy Neutron activation analysis Magnetic resonance imaging Nuclear magnetic resonance spectroscopy Focused ion beam X-ray reflectivity Low-angle laser light scattering X-ray Raman scattering Angle-resolved photoemission spectroscopy Reflection electron microscopy SSM Stimulated emission depletion microscopy ... and more

About: clgo:Materials_analysis_method