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About:
clgo:
Semiconductor_device_defect
Property
Value
rdf:
type
owl:
Class
rdfs:
label
Semiconductor device defect
rdfs:
subClassOf
owl:
Thing
prov:
wasDerivedFrom
http://en.wikipedia.org/wiki/Category:Semiconductor_device_defects
is
rdf:
type
of
Current crowding
Failure of electronic components
Hot-carrier injection
QBD (electronics)
Feedback-controlled electromigration
Transistor aging
Head crash
Electromigration
Current filament
Radiation hardening
Time-dependent gate oxide breakdown
Latch-up
Catastrophic optical damage
Thermal runaway
Conductive anodic filament
Stress-induced leakage current
Negative-bias temperature instability