Secondary ion mass spectrometry

Property	Value
rdf:type	owl:NamedIndividual Materials analysis method
rdfs:label	Secondary ion mass spectrometry
owl:sameAs	dbr:Secondary_ion_mass_spectrometry
prov:wasDerivedFrom	http://en.wikipedia.org/wiki/Fobos-Grunt http://en.wikipedia.org/wiki/Ultra-high_vacuum http://en.wikipedia.org/wiki/Low-energy_ion_scattering http://en.wikipedia.org/wiki/Index_of_physics_articles_(S) http://en.wikipedia.org/wiki/List_of_materials_analysis_methods http://en.wikipedia.org/wiki/Elastic_recoil_detection http://en.wikipedia.org/wiki/Semiconductor_characterization_techniques http://en.wikipedia.org/wiki/Nanometrology http://en.wikipedia.org/wiki/Characterization_(materials_science)
skos:prefLabel	Secondary ion mass spectrometry
skos:altLabel	SIMS Time-of-Flight Secondary Ion Mass Spectrometer (TOF-SIMS) SIMS imaging SIMS surface analysis Secondary Ion Analysers Secondary Ion Mass Spectrometer Secondary Ion Mass Spectrometry Secondary ion mass spectroscopy ion probe secondary ion mass spectrometer secondary ion mass spectrometry secondary ion mass spectrometry (SIMS) secondary ionization mass spectrometry secondary-ion ionization
is clgo:knownFor of	Purushottam Chakraborty

About: clgr:Secondary_ion_mass_spectrometry